Compressively Strained InxAl1-xN/Al0.22Ga0.78N/GaN (x= 0.245–0.325) Heterostructure Field Effect Transistors with Regrown AlGaN Contact Layers
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
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1. Power electronics on InAlN/(In)GaN: Prospect for a record performance
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1. Beneficial effect of hydrogen in aluminum oxide deposited through the atomic layer deposition method on the electrical properties of an indium–gallium–zinc oxide thin-film transistor;Journal of Information Display;2016-04-02
2. Unintentional Ga incorporation in metalorganic vapor phase epitaxy of In-containing III-nitride semiconductors;Journal of Crystal Growth;2013-11
3. Native Oxide Removal from InAlN Surfaces by Hydrofluoric Acid Based Treatment;IEICE Transactions on Electronics;2013
4. Local stress induced by diamond-like carbon liner in AlGaN/GaN metal-oxide-semiconductor high-electron mobility transistors and impact on electrical characteristics;Applied Physics Letters;2011-05-02
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