Effect of strain, thickness, and local surface environment on electron transport properties of oxygen-terminated copper thin films-Reference-Cited by-同舟云学术

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Effect of strain, thickness, and local surface environment on electron transport properties of oxygen-terminated copper thin films

Published:2016-10-05 Issue:15 Volume:94 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Sanchez-Soares Alfonso,Jones Sarah L. T.,Plombon John J.,Kaushik Ananth P.,Nagle Roger E.,Clarke James S.,Greer James C.

Funder

Irish Research Council

Science Foundation Ireland

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.94.155404/fulltext

Reference46 articles.

1. Size-dependent resistivity of metallic wires in the mesoscopic range

2. Analysis of the size effect in electroplated fine copper wires and a realistic assessment to model copper resistivity

3. The conductivity of thin metallic films according to the electron theory of metals

4. Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

5. Size-Dependent Resistivity in Nanoscale Interconnects

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2. Size effect of resistivity due to surface roughness scattering in alternative interconnect metals: Cu, Co, Ru, and Mo;Physical Review B;2023-05-12

3. Effect of electronegativity on electron surface scattering in thin metal layers;Applied Physics Letters;2022-01-24

4. Fully resolved currents from quantum transport calculations;Physical Review B;2021-05-05

5. The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges;Journal of Applied Physics;2018-04-21

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