Stress Release Effect of Micro-hole Arrays for Flexible Electrodes and Thin Film Transistors-Reference-Cited by-同舟云学术

Stress Release Effect of Micro-hole Arrays for Flexible Electrodes and Thin Film Transistors

Published:2020-04-02 Issue:16 Volume:12 Page:19226-19234
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Lee Gwang Jun¹,Heo Su Jin¹,Lee Seungchul¹²,Yang Jae Hoon¹,Jun Byoung Ok¹,Kim Hyun Sik³,Jang Jae Eun¹^ORCID

Affiliation:

1. Department of Information and Communication Engineering, Daegu Gyeongbuk Institute of Science and Technology (DGIST), Daegu 42988, Republic of Korea

2. Samsung Electronics, Hwaseong 18448, Republic of Korea

3. Department of Materials Science and Engineering, Hongik University, Seoul 04066, Republic of Korea

Funder

Samsung

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.0c02362

Reference38 articles.

1. Fully Solution-Processed and Foldable Metal-Oxide Thin-Film Transistor

2. Flexible organic transistors and circuits with extreme bending stability

3. Power saving through state retention in IGZO-TFT AMOLED displays for wearable applications

4. Wireless thin film transistor based on micro magnetic induction coupling antenna

5. Adaptive Fabrication of a Flexible Electrode by Optically Self-Selected Interfacial Adhesion and Its Application to Highly Transparent and Conductive Film

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