Thickness‐Dependent Refractive Index of 1L, 2L, and 3L MoS 2 , MoSe 2 , WS 2 , and WSe 2-Reference-Cited by-同舟云学术

Thickness‐Dependent Refractive Index of 1L, 2L, and 3L MoS 2 , MoSe 2 , WS 2 , and WSe 2

Published:2019-05-06 Issue:13 Volume:7 Page:1900239
ISSN:2195-1071
Container-title:Advanced Optical Materials
language:en
Short-container-title:Adv. Optical Mater.

Author:

Hsu Chunwei¹²,Frisenda Riccardo¹^ORCID,Schmidt Robert³,Arora Ashish³,Vasconcellos Steffen Michaelis³,Bratschitsch Rudolf³,Zant Herre S. J.²,Castellanos‐Gomez Andres¹

Affiliation:

1. Materials Science Factory Instituto de Ciencia de Materiales de Madrid (ICMM) Consejo Superior de Investigaciones Científicas (CSIC) Sor Juana Inés de la Cruz 3 28049 Madrid Spain

2. Kavli Institute of Nanoscience Delft University of Technology Delft 2600 GA The Netherlands

3. Institute of Physics and Center for Nanotechnology University of Münster 48149 Münster Germany

Funder

Nederlandse Organisatie voor Wetenschappelijk Onderzoek

Publisher

Wiley

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adom.201900239

Reference29 articles.

1. Electronics and optoelectronics of two-dimensional transition metal dichalcogenides