Modeling the coverage of MoS2 and WS2 thin films using in-situ spectroscopic ellipsometry
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Published:2024-08
Issue:
Volume:640
Page:127741
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ISSN:0022-0248
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Container-title:Journal of Crystal Growth
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language:en
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Short-container-title:Journal of Crystal Growth
Author:
Houser Elizabeth,
Mc Knight Thomas V.,
Redwing Joan M.ORCID,
Peiris Frank C.
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