Correction of image drift and distortion in a scanning electron microscopy
Author:
Affiliation:
1. Department of Engineering Mechanics; AML, Tsinghua University; Beijing China
2. Center for Nano and Micro Mechanics; Tsinghua University; Beijing China
Funder
NSFC
National Basic Research Program of China
SRFDP
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12293/fullpdf
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4. Strain measurement at the nanoscale: comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography;Béché;Ultramicroscopy,2013
5. A method for measuring microstructural-scale strains using a scanning electron microscope: applications to γ-titanium aluminides;Biery;Metall. Mater. Trans. A,2003
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