Author:
Tang Zhaohui,Zhao Jun,Deng Xiao,Tan Wen,Wu Yanqing,Tai Renzhong,Cheng Xinbin,Li Tongbao
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference34 articles.
1. F. Marinello, S. Carmignato, A. Voltan, E. Savio, L. De Chiffre, Error Sources in Atomic Force Microscopy for Dimensional Measurements: Taxonomy and Modeling, J. Manuf. Sci. E-T. Asme. 132 (2010).
2. Correction of image drift and distortion in a scanning electron microscopy;Jin;J. Microsc.,2015
3. Nanometric lateral scales as CRM candidates for AFM, SEM and optical diffractometer;Misumi;J. Phys. Conf. Ser.,2005
4. Advances in traceable nanometrology at the National Physical Laboratory;Leach;Nanotechnology,2001
5. Optical frequency standards based on molecules, atoms and ions;Plimmer;Phys. Scripta,2004
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献