Etched track profiles for relativistic 7 GeV silicon and 17.48 GeV Nickel ions in PADC detector: The case study of convex track walls

Author:

Fromm M.,Abu-Shady M.,Groetz J.E.,Awad E.M.

Publisher

Elsevier BV

Subject

Radiation

Reference65 articles.

1. A curing cycle for detector-quality CR-39;Adams,1982

2. Track etching technique in membrane technology;Apel;Radiat. Meas.,2001

3. Effect of nanosized surfactant molecules on the etching of ion tracks: new degrees of freedom in design of pore shape;Apel;Nucl. Instrum. Methods Phys. Res. Sect. B Beam Interact. Mater. Atoms,2003

4. Depth sensitivity of Lexan polycarbonate detector;Awad;Radiat. Meas.,1999

5. Direct determination of track etch rate and response of CR-39 to normal incidence high-energy heavy ions;Awad;Radiat. Meas.,2001

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