Thick Film Resistor Failures

Author:

Shrivastava Anshul1,Amin Ahmed1,Sood Bhanu1,Azarian Michael1,Pecht Michael1,Zagami Michael2

Affiliation:

1. University of Maryland, College Park, MD, USA

2. Fairchild Controls, Frederick, MD, USA

Abstract

Abstract Thick film resistors are widely used in consumer and industrial products such as timers, motor controls and a broad range of high performance electronic equipment. This article provides information on failures due to copper dendrite growth, silver migration, sulfur atmosphere corrosion, variation of temperature, and crack due to molding compound mechanisms. It presents case studies in which a physical analysis plan was developed and executed to investigate these sites of interest on as-manufactured and failed thick film power resistors. The analysis techniques included X-ray inspection, cross-sectioning, decapsulation, and optical and environmental scanning electron microscopy analysis. A table illustrates different failure modes and mechanisms for thick film resistors, and also potential application and manufacturing factors that cause failure mechanisms, which then describe the failure modes. The article is concluded that by preventing the failure of thick film resistors, printed circuit boards can be kept in service for their full lifetime.

Publisher

ASM International

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Pre-Mature Reliability Degradation of 5G Network Electronics in Unknown Hostile Environment;2024 Annual Reliability and Maintainability Symposium (RAMS);2024-01-22

2. Case Analysis and Improvement of Silver Migration in Resistors;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08

3. EEE Component Defects;Electronics Production Defects and Analysis;2022

4. High-performance electrical properties of La-based perovskite ceramics for the functional phase of thick film resistors;Journal of Alloys and Compounds;2021-06

5. Testing method for measuring corrosion resistance of surface mount chip resistors;Microelectronics Reliability;2012-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3