A 1200 V-class Fin P-body IGBT with ultra-narrow-mesas for low conduction loss

Author:

Feng Hao,Yang Wentao,Onozawa Yuichi,Yoshimura Takashi,Tamenori Akira,Sin Johnny K.O.

Publisher

IEEE

Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Study of the high-k/SiO2 stacked gate micro-pattern trench CSTBT;Microelectronics Reliability;2024-07

2. 3-D Segmented Gate Concept: A New IGBT Solution for Reduced Loss and Improved Safe-Operating Area;IEEE Transactions on Electron Devices;2023-06

3. A Fast and Soft Reverse Recovery Diode With a Punch-Through NPN Structure;IEEE Electron Device Letters;2023-01

4. Silicon Power Devices;Springer Handbook of Semiconductor Devices;2022-11-11

5. 1.2 kV Stepped Oxide Trench Insulated Gate Bipolar Transistor with Low Loss for Fast Switching Application;ECS Journal of Solid State Science and Technology;2022-11-01

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