Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification-Reference-Cited by-同舟云学术

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Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification

Published:2013-09 Issue:9 Volume:60 Page:3976-3982
ISSN:0278-0046
Container-title:IEEE Transactions on Industrial Electronics
language:
Short-container-title:IEEE Trans. Ind. Electron.

Author:

Li Tung-Yen,Tsai Jang-Zern,Chang Rong-Seng,Ho Li-Wei,Yang Ching-Fu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx5/41/6512583/06236141.pdf?arnumber=6236141

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design and implementation of machine learning models to classify and mitigate muras of a micro-LED display;Microsystem Technologies;2023-04-10

2. A Novel Multicategory Defect Detection Method Based on the Convolutional Neural Network Method for TFT-LCD Panels;Mathematical Problems in Engineering;2022-02-16

3. Image Demoireing via U-Net for Detection of Display Defects;IEEE Access;2022

4. Moisture-resistant and highly adhesive acrylate-based sealing materials embedded with oxime-based photoinitiators for hermetic optical devices;Korean Journal of Chemical Engineering;2021-11-20

5. CNNs Combined With a Conditional GAN for Mura Defect Classification in TFT-LCDs;IEEE Transactions on Semiconductor Manufacturing;2021-02

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