System for Diagnostics of Critical Technical Structures as an Element of Risk Monitoring-Reference-Cited by-同舟云学术

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System for Diagnostics of Critical Technical Structures as an Element of Risk Monitoring

Published:2023-10-13 Issue: Volume:80 Page:1-5
ISSN:
Container-title:2023 13th International Conference on Dependable Systems, Services and Technologies (DESSERT)
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Author:

Kuzmych Lyudmyla¹

Affiliation:

1. Pennsylvania State University,University Park,PA,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10416400/10416430/10416469.pdf?arnumber=10416469

Reference35 articles.

1. Stress dependence of the metal-insulator transition in doped semiconductors

2. Digital’s Kompensation sverfahren zur Verbesserung von Messfuhlern;Erb;Bulletin SEV/VSE,1989

3. SCXI Universal Strain Grade Input: SCXI-1540

4. Eight-Channel Isolated Frequency Input Module for Signal Conditioning;National Instruments Corporation

5. Field Wiring and Noise Considerations for Analog Signals [Electronic resource],2014

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