Study on Contact-Free Scanning and Imaging Reliability for Low Electric Field SICM With Dual-Barrel Pipette-Reference-Cited by-同舟云学术

Study on Contact-Free Scanning and Imaging Reliability for Low Electric Field SICM With Dual-Barrel Pipette

Published:2024-04-01 Issue:7 Volume:24 Page:11261-11269
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Wang Zhiwu¹^ORCID,Zhuang Jian²^ORCID,Cheng Lei²^ORCID,Gao Zijun²,Wang Wenhao¹,Liao Xiaobo³^ORCID

Affiliation:

1. School of Mechanical Engineering, Taiyuan University of Science and Technology, Taiyuan, China

2. Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System and the School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, China

3. School of Manufacturing Science and Engineering, Southwest University of Science and Technology, Mianyang, China

Funder

Basic Research Program of Shanxi Province

Excellent Doctoral Graduates Work Award and Subsidy Fund of Shanxi Province

Taiyuan University of Science and Technology Scientific Research Initial Funding

National Natural Science Foundation of China

Natural Science Foundation of Sichuan Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/7361/10487994/10456561.pdf?arnumber=10456561

Reference34 articles.

1. The Scanning Ion-Conductance Microscope

2. Scanning Ion Conductance Microscopy

3. Probing and Visualizing Interfacial Charge at Surfaces in Aqueous Solution

4. Scanning ion conductance microscopy of isolated metaphase chromosomes in a liquid environment

5. High-resolution label-free 3D mapping of extracellular pH of single living cells

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