MEMS-based sample carriers for simultaneous heating and biasing experiments: A platform for in-situ TEM analysis
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7986674/7993963/07994502.pdf?arnumber=7994502
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Real-space visualization of a defect-mediated charge density wave transition;Proceedings of the National Academy of Sciences;2024-08-06
2. Atomically Stable Cryogenic In Situ Biasing (S)TEM holder with Precise Temperature Control Over a Wide Range of Temperatures;Microscopy and Microanalysis;2024-07
3. Microheater Chips with Carbon Nanotube Resistors;ACS Applied Materials & Interfaces;2024-04-30
4. Sample Preparation Method for In-Situ Tem Analysis in Integrated Circuits;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17
5. In operando cryo-STEM of pulse-induced charge density wave switching in TaS2;Nature Communications;2023-12-11
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