Self-Heating Induced Reliability Issues and Revealing Early Ageing in Thin PDSOI Transistor-Reference-Cited by-同舟云学术

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Self-Heating Induced Reliability Issues and Revealing Early Ageing in Thin PDSOI Transistor

Published:2024-03-03 Issue: Volume: Page:1-3
ISSN:
Container-title:2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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Author:

Kumar Amit¹,Banchhor Shashank²,Pal Pradyum¹,Pratap Narendra³,Kumar Shubham¹,Yadav Ashutosh⁴,Dasgupta Sudeb³,Bulusu Anand³,Chauhan Nitanshu¹

Affiliation:

1. NIT Uttarakhand,Department of Electronics Engineering,Srinagar Pauri Garhwal,India,246174

2. Intel Corporation,India

3. IIT Roorkee,Department of ECE,Roorkee,India

4. SCL Chandigarh,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10511270/10511310/10511721.pdf?arnumber=10511721

Reference5 articles.

1. Improvement of RF Performance by Using Tunnel Diode Body Contact Structure in PD SOI nMOSFETs

2. Grasping SOI floating-body effects

3. On the Prediction of the Threshold Voltage Degradation in CMOS Technology Due to Bias-Temperature Instability

4. Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI

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