Inspection of the undulation structure with an in-plane differential flexible array probe-Reference-Cited by-同舟云学术

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Inspection of the undulation structure with an in-plane differential flexible array probe

Published:2021-06-23 Issue: Volume: Page:
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Container-title:2021 IEEE 8th International Workshop on Metrology for AeroSpace (MetroAeroSpace)
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Author:

Peng Lei,Ye Chaofeng,Tao Yu,Long Cai,Li Ming

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9511649/9511650/09511698.pdf?arnumber=9511698

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Improving Defect Detection in Eddy Current Testing using Multi-Frequency Rotating Eddy Current Strategy;2024 11th International Workshop on Metrology for AeroSpace (MetroAeroSpace);2024-06-03

3. An Eddy Current Probe for the Detection of Subsuperficial Defects of Any Orientation;IEEE Transactions on Instrumentation and Measurement;2024

4. A Novel multi-excitation ECT Probe for Deep Defects with any Orientation;2023 IEEE 10th International Workshop on Metrology for AeroSpace (MetroAeroSpace);2023-06-19

5. Effects of curvature radius on flexible eddy current array sensors for the curved surface of metal components;Frontiers in Physics;2022-08-29

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