Simulation Method for Multiscale Failure of Optocoupler Based on Aging of Solder Layer in Photovoltaic MOSFET-Reference-Cited by-同舟云学术

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Simulation Method for Multiscale Failure of Optocoupler Based on Aging of Solder Layer in Photovoltaic MOSFET

Published:2023-11-10 Issue: Volume:27 Page:1615-1619
ISSN:
Container-title:2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)
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Author:

Chen Xuan¹,Yao Ran¹,Li Hui¹,Lai Wei¹,Min Yuan²,Yang Cheng¹,Duan Zeyu¹,Chen Siyu¹,Xing Zhen¹

Affiliation:

1. Chongqing University,State Key Laboratory of Power Transmission Equipment Technology,Chongqing,China

2. Nuclear Power Institute of China,Science and Technology on Reactor System Design Technology Laboratory,Chengdu,China

Funder

National Science Foundation of China

China Postdoctoral Science Foundation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10394673/10394683/10394694.pdf?arnumber=10394694

Reference9 articles.

1. Structure design and package characteristics of optocoupler;Tian;Semiconductor Technology,2002

2. Operation and maintenance status and reliability analysis of rod-controlled power cabinet;Yuan;Application of Electronic Technique,2022

3. Research on Optical Coupler Life Analysis Based on Failure Physics Principle;Huang;Chinese Journal of Electron Devices,2020

4. Reliablity research and application of early failure of Optocopler(OCEP);Li;Electronic Engineering & Product World,2022

5. Package and Corresponding Failure Mechanism of Optical Couplers;Xiao;Semiconductor Technology,2011

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