Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes-Reference-Cited by-同舟云学术

Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes

Published:2023 Issue: Volume:11 Page:19928-19940
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Herzog Alexander¹^ORCID,Benkner Simon¹^ORCID,Zandi Babak¹^ORCID,Buffolo Matteo²^ORCID,Van Driel Willem D.³^ORCID,Meneghini Matteo²^ORCID,Khanh Tran Quoc¹^ORCID

Affiliation:

1. Laboratory of Adaptive Lighting Systems and Visual Processing, Technische Universität Darmstadt, Darmstadt, Germany

2. Department of Electrical Engineering, University of Padova, Padova, Italy

3. EEMCS Faculty, Delft University of Technology, CD Delft, The Netherlands

Funder

ECSEL Joint Undertaking (JU) through the European Union’s Horizon 2020 Research and Innovation Program by The Netherlands, Hungary, France, Poland, Austria, Germany, Italy, Switzerland

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/6287639/10005208/10054008.pdf?arnumber=10054008

Reference73 articles.

1. Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

2. Degradation of UV-A LEDs: Physical Origin and Dependence on Stress Conditions

3. Interactions of hydrogen with native defects in GaN

4. Advances in UV-A and UV-C LEDs and the applications they enable

5. Impact of defects on Auger recombination in c-plane InGaN/GaN single quantum well in the efficiency droop regime

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhancing Artificial Lighting Source’s Reliability in Public Libraries: Insights into Failure Analysis and Fault Diagnosis;2024 IEEE International Conference on Prognostics and Health Management (ICPHM);2024-06-17

2. A survey on LED Prognostics and Health Management and uncertainty reduction;Microelectronics Reliability;2024-06

3. Study on Degradation of Deep‐Ultraviolet Laser Diode;physica status solidi (a);2024-02-26

4. LED Degradation Monitoring Using a Multi-Channel Spectral Sensor;IEEE Access;2024

5. MECHANISM AND REGULARITY FOR LUMINOUS FLUX DECREASING OF EFFICIENT SMALL POWERED LEDS BASED ON GaN/InGaN STRUCTURES AT HIGH CURRENT DENSITY;LIGHT ENG;2024