Photovoltaic Cell Defect Detection by Lock-In Thermography Using 2-D Gaussian Profile-Reference-Cited by-同舟云学术

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Photovoltaic Cell Defect Detection by Lock-In Thermography Using 2-D Gaussian Profile

Published:2024-05 Issue:3 Volume:14 Page:480-487
ISSN:2156-3381
Container-title:IEEE Journal of Photovoltaics
language:
Short-container-title:IEEE J. Photovoltaics

Author:

Vieira Thiago Mota¹^ORCID,Santana Ézio C.²^ORCID,Ferreira Tarso V.¹^ORCID,Riffel Douglas B.³^ORCID

Affiliation:

1. Automation, Control and Simulation Laboratory, Universidade Federal de Sergipe, São Cristóvão, Brazil

2. Laboratory for Advanced Process and Sustainability, Universidade Federal de Sergipe, São Carlos, Brazil

3. Engineering and Energy Laboratory, Universidade Federal de Sergipe, São Cristóvão, Brazil

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/5503869/10506739/10438520.pdf?arnumber=10438520

Reference21 articles.

1. Validation of thermal imaging as a tool for failure mode detection development

2. Application of thermal wave imaging and phase shifting method for defect detection in Stainless steel

3. Noncontact Electromagnetic Induction Excited Infrared Thermography for Photovoltaic Cells and Modules Inspection

4. Non-destructive Testing of Airfoil Based on Infrared Lock-in Thermography

5. Active Thermography Data-Processing Algorithm for Nondestructive Testing of Materials

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