Focused Ion Beam Milling of Soft Materials for Improved Sample Preparation-Reference-Cited by-同舟云学术

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Focused Ion Beam Milling of Soft Materials for Improved Sample Preparation

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Isik Tugba¹,Wang Guanyi²³,Liu Yijin⁴,Liu Yuzi²,Chen Si¹

Affiliation:

1. X-ray Science Division, Argonne National Laboratory , Lemont, IL , United States

2. Nanoscience and Technology Argonne National Laboratory , Lemont, IL , United States

3. Department of Chemical and Paper Engineering, Western Michigan University , Kalamazoo, MI , United States

4. Walker Department of Mechanical Engineering, The University of Texas at Austin , Austin, TX , United States

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.975/58670133/ozae044.975.pdf

Reference6 articles.

1. Micromachining tools and correlative approaches for cellular cryo-electron tomography

2. Large volume serial section tomography by Xe Plasma FIB dual beam microscopy

3. TEM Specimen Preparation with Plasma FIB Xe+ Ions

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