Atomic Resolution Secondary Electron Imaging of Top and Bottom Surfaces-Reference-Cited by-同舟云学术

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Atomic Resolution Secondary Electron Imaging of Top and Bottom Surfaces

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Plotkin-Swing B¹,Martis J¹,Su C²,Hotz M T¹,Dellby N¹,Radlička T³,Krivanek O L¹⁴,Lovejoy T C¹

Affiliation:

1. Bruker AXS (formerly Nion R&D) , Kirkland, WA , USA

2. Dept. of Mechanical Engineering and Materials Science, Yale University , New Haven, CT , USA

3. Institute of Scientific Instruments of Czech Academy of Sciences , Brno , Czech Republic

4. Department of Physics, Arizona State U. , Tempe, AZ , USA

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.731/58638558/ozae044.731.pdf

Reference7 articles.

1. Imaging single atoms using secondary electrons with an aberration-corrected electron microscope

2. Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

3. Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM

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