Affiliation:
1. Max-Planck-Institut für Plasmaphysik
2. Ansaldo Ricerche S.p.A
3. Forschungszentrum Jülich
Abstract
Thin TiCx films with a range from pure Ti to stoichiometric TiC (0 ≤ x ≤ 1) have been deposited on carbon-based materials by dual magnetron sputter deposition. The wetting behaviour of a Cu Ti alloy on TiCx coatings has been characterized using the sessile drop method. For these experiments a contact angle measurement device was constructed and successfully tested. Both, stoichiometric TiC and Ti coatings improve wetting dramatically. In between there was no significant wetting improving effect compared to the uncoated case. Subsequently, TiCx coated C/Cu braze joints have been tested on their ability to withstand mechanical loads and analysed with respect to their fracture behaviour.
Publisher
Trans Tech Publications, Ltd.
Cited by
1 articles.
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