Interface Reactions of Joining Al2O3 Ceramics by Microwave Method

Abstract

Nanometer Si powders were used as interlayer materials, which were expected to be microwave heated rapidly and reacted with the surface of Al2O3ceramics to form the low eutectoid compound. The phenomena of element migration of joint samples were investigated by energy dispersive spectroscopy (EDS) and the interface phase transition was analyzed by X-ray diffraction (XRD). The results indicated that the low eutectoid compound of the joint interface wetted and penetrated to the ceramic surface. The variation of micro-hardness at the interface across the parent material was measured by micro-hardness instrument and the interfacial microstructure and the fracture surface were investigated by scanning electron microscopy (SEM).