Study on Microstructures and Interdiffusion Behavior in $\bf Pt/Ti/SiO_{2}/Si$ and $\bf Pb(Zr, Ti)O_{3}/Pt/Ti/SiO_{2}/Si$ Multilayer Systems-Reference-Cited by-同舟云学术

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Study on Microstructures and Interdiffusion Behavior in $\bf Pt/Ti/SiO_{2}/Si$ and $\bf Pb(Zr, Ti)O_{3}/Pt/Ti/SiO_{2}/Si$ Multilayer Systems

Published:1995-09-15 Issue:Part 1, No. 9A Volume:34 Page:4945-4949
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kim Sung-Tae,Kim Cha-Yeon,Park Kyu-Ho,Kim Kwang-Young,Lee Jeong Soo,Jeong Young Woo,Kwon Hyun Ja

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films;Advanced Materials Interfaces;2015-06-01

2. The effects of texture and grain morphology on the fracture toughness and fatigue crack growth resistance of nanocrystalline platinum films;International Journal of Fatigue;2015-01

3. Effect of Double Doping in Lead Zirconate Titanate (PZT) Lattices by Sol-Gel Technique for MEMS Applications;Integrated Ferroelectrics;2010-11-12

4. The impact of annealing temperature and time on the electrical performance of Ti/Pt thin films;Applied Surface Science;2010-05

5. Electrical performance of Ti/Pt thin films on glass-ceramic substrates after high temperature loading;Applied Physics A;2009-05-15

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