Temperature Stability of Dynamic-Threshold Mode SiGe p-Metal–Oxide–Semiconductor Field Effect Transistors
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Published:2005-12-08
Issue:12
Volume:44
Page:8453-8455
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Liao Wei-Ming,Li Pei-Wen
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering