Evidence of Correlation between Dark Spots and Dislocations Originating from Substrate in Light-Emitting Diodes
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Published:2005-02-08
Issue:2
Volume:44
Page:1004-1008
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Hobo Kenji,Sone Hidetoshi,Kato Toshihiro,Hirotani Masumi,Saka Takashi
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
1 articles.
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1. Reliability of AlGaN-based deep UV LEDs on sapphire;Light-Emitting Diodes: Research, Manufacturing, and Applications X;2006-02-09