Abstract
This study presents the synthesis and characterization of CdSnO3 thin films at different deposition temperatures 400, 500 and 600 °C. The prepared samples were characterized by XRD, FTIR, SEM, EDAX, TEM, optical and ammonia gas sensing properties respectively. X-ray diffraction confirms the orthorhombic crystal structure, with prominent peaks corresponding to the (111), (112), (103), (130), and (133) planes. The mean crystallite size is determined to be 84 nm. Scanning electron microscopy reveals morphological changes with varying substrate temperatures. Energy-dispersive X-ray spectroscopy shows elemental composition variations, highlighting non-stoichiometric CdSnO3 thin films. Transmission electron microscopy images depict larger spherical thin films with clear lattice fringes. Fourier-transform infrared spectra confirm the presence of Cd-O and Sn-O bonds. Optical properties yield a calculated band gap was decreased with increase in temperature. Gas sensing tests demonstrate significant sensitivity to ammonia gas concentrations, with responses affected by ammonia concentrations. Overall, CdSnO3 thin films show promise for applications in diverse fields due to their tunable properties and potential for tailored performance.
Publisher
The Electrochemical Society