Author:
Pearton S. J.,Ren F.,Patrick Erin,Law M. E.,Polyakov Alexander Y.
Publisher
The Electrochemical Society
Subject
Electronic, Optical and Magnetic Materials
Reference211 articles.
1. See, for example, Nitride Semiconductor Devices-Principles and Simulation, ed. Piprek J. (Wiley-VCH, Weinheim, 2007);
2. III-V Compound Semiconductors-Integration with Si-Based Microelectronics, ed. Li T. Mastro M. Dadgar A. (CRC Press, Boca Raton, 2011);
3. GaN Processing for Electronics, Sensors and Spintronics (Springer, London, 2006).
4. Deep traps in GaN-based structures as affecting the performance of GaN devices
5. 2 MeV proton radiation damage studies of gallium nitride films through low temperature photoluminescence spectroscopy measurements
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