Publisher
SPIE-Intl Soc Optical Eng
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Dziomba, T., L. Koenders and G. Wilkening , “Towards a guideline for SPM calibration,” inNanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro- and Nanometer Range, G. Wilkening and L. Koenders , eds., Wiley-VCH GmbH & Co., New York, pp. 173–192, (2005).
2. Calibration of a commercial AFM: traceability for a coordinate system
3. Design and characterization of MIKES metrological atomic force microscope
4. Metrological large range scanning probe microscope
5. Traceable calibration of transfer standards for scanning probe microscopy
Cited by
14 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献