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Large format MBE HgCdTe on silicon detector development for astronomy

  • Published:2015-08-28 Issue: Volume: Page:
  • ISSN:0277-786X
  • Container-title:SPIE Proceedings
  • language:
  • Short-container-title:

Author:

Hanold Brandon J.,Figer Donald F.,Lee Joong,Kolb Kimberly,Marcuson Iain,Corrales Elizabeth,Getty Jonathan,Mears Lynn

Publisher

SPIE

Reference12 articles.

1. Large format high-operability SWIR and MWIR focal plane array performance and capabilities;Bangs,2011, April 25

2. Performance Overview of VISTA IR Detectors;Bezawada,2005

3. Independent Testing of JWST Detector Prototypes;Figer,2003

4. The Independent Detector Testing Laboratory and the NGST Detector Program;Figer,2002

5. Wide FOV FPAs for a Shipboard Distributed Aperture System;Gulbransen,2004

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1. Molecular-beam epitaxy-grown HgCdTe infrared detector: Material physics, structure design, and device fabrication;Science China Physics, Mechanics & Astronomy;2023-02-10

2. The SATIN infrared detector development program and the road to HELLSTAR;X-Ray, Optical, and Infrared Detectors for Astronomy X;2022-08-29

3. Electrical properties of the Hg0.7Cd0.3Te films grown by MBE method on Si(0 1 3) substrates;Infrared Physics & Technology;2018-11

4. High performance SWIR HgCdTe 320x256/30µm FPAs at Teledyne Judson Technologies;Infrared Sensors, Devices, and Applications VIII;2018-09-26

5. Advanced technologies and instrumentation and the National Science Foundation;Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III;2018-07-10
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