Subsurface fluorescence time-of-flight imaging using a large-format single-photon avalanche diode sensor for tumor depth assessment

Author:

Petusseau Arthur F.1,Streeter Samuel S.2,Ulku Arin3,Feng Yichen4,Samkoe Kimberley S.4,Bruschini Claudio3,Charbon Edoardo3,Pogue Brian W.1,Bruza Petr1

Affiliation:

1. Dartmouth College, Thayer School of Engineering and Dartmouth Cancer Center, Hanover, New Hampshire, United States

2. Geisel School of Medicine at Dartmouth, Department of Orthopaedics, Hanover, New Hampshire, United States

3. Ecole polytechnique fédérale de Lausanne, Advanced Quantum Architecture Laboratory, Neuchâtel, Switzerland

4. Geisel School of Medicine at Dartmouth, Department of Surgery, Hanover, New Hampshire, United States

Publisher

SPIE-Intl Soc Optical Eng

Subject

Biomedical Engineering,Atomic and Molecular Physics, and Optics,Biomaterials,Electronic, Optical and Magnetic Materials

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