Degradation of commercial high-brightness GaP:N green light emitting diodes
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.367889
Reference21 articles.
1. Defect structure induced during forward‐bias degradation of GaP green‐light‐emitting diodes
2. Deep‐level changes associated with the degradation of gallium phosphide red‐light‐emitting diodes
3. Degradation induced formation of extended defects in GaP:N LED's
4. Nitrogen related deep electron trap in GaP
5. VP Related Defects in Diffused GaP:N Diodes
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