Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescence-Reference-Cited by-同舟云学术

Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescence

Published:1973-10-01 Issue:10 Volume:44 Page:4749-4752
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:

Author:

Shabason L.¹,Cohen B. L.¹,Wedberg G. H.¹,Chan K. C.¹

Affiliation:

1. Nucelar Physics Laboratory, University of Pittsburgh, Pittsburgh, Pennsylvania 15213

Abstract

A procedure is described for obtaining quantitative analysis of trace elements in a thick sample by heavy-ion-induced x-ray fluorescence. The method avoids difficulties involved in preparing thin uniform samples and yields absolute abundances of impurity elements without utilizing internal standards.

Publisher

AIP Publishing

Link

https://pubs.aip.org/aip/jap/article-pdf/44/10/4749/18365792/4749_1_online.pdf

Reference2 articles.

1. X-Ray Production by Alpha-Particle Impact

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