The transition between the collision-dominated and ballistic electron transport regimes as the device length is reduced: A continuum analysis

Author:

Azimi Alireza1ORCID,Azimi Mohammadreza1ORCID,Shur Michael S.2ORCID,O’Leary Stephen K.1ORCID

Affiliation:

1. School of Engineering, The University of British Columbia 1 , Kelowna, British Columbia V1V 1V7, Canada

2. Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute 2 , Troy, New York 12110, USA

Abstract

Noting that the conventional collision-dominated electron transport perspective is only relevant when the length scale over which the transit occurs is greater than the electron’s mean free path, one can conceptually partition the electron transport “space” into collision-dominated and ballistic electron transport regimes. As the boundaries between these regimes are quite porous, in this analysis, we devise a means of quantitatively examining the transition between electron transport regimes as the length scale is reduced on a continuum basis. Our approach introduces a collision-dominated fractional scattering parameter, this parameter quantifying the fraction of the total scattering rate that arises purely from bulk scattering processes, contact scattering also contributing to the total scattering rate. We pursue this analysis for two conventional semiconductors of interest, silicon and gallium arsenide. A determination of the dependence of the results on both the length scale and the crystal temperature is pursued. Finally, for the specific case of room temperature, a comparison with the results of experiment is performed.

Funder

RES'EAU-WaterNET

Mitacs

Publisher

AIP Publishing

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3