Ultrafast broadband frequency modulation of a continuous wave reflectometry system to measure density profiles on ASDEX Upgrade-Reference-Cited by-同舟云学术

Ultrafast broadband frequency modulation of a continuous wave reflectometry system to measure density profiles on ASDEX Upgrade

Published:1996-12 Issue:12 Volume:67 Page:4138-4145
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Silva A.,Manso M. E.,Cupido L.,Albrecht M.,Serra F.,Varela P.,Santos J.,Vergamota S.,Eusébio F.,Fernandes J.,Grossmann T.,Kallenbach A.,Kurzan B.,Loureiro C.,Meneses L.,Nunes I.,Silva F.,Suttrop W.,

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1147517

Reference7 articles.

1. Measurement of electron density profile by microwave reflectometry on tokamaks

2. Pulse radar technique for reflectometry on thermonuclear plasmas

3. A swept two‐frequency microwave reflectometer for edge density profile measurements on TFTR

4. Advances in reflectometric density profile measurements on the DIII‐D tokamaka)

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