Infrared grey-field polariscope: A tool for rapid stress analysis in microelectronic materials and devices
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1884189
Reference51 articles.
1. X-Ray Diffraction Determination of Stresses in Thin Films
2. Proceedings of the IEEE Ultrasonics Symposium;Wang S. K.,1977
3. Thermal stresses and cracking resistance of dielectric films (SiN, Si3N4, and SiO2) on Si substrates
4. Measurement and Interpretation of stress in aluminum-based metallization as a function of thermal history
5. The tension of metallic films deposited by electrolysis
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