An experimental study of the source/drain parasitic resistance effects in amorphous silicon thin film transistors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.351809
Reference9 articles.
1. Present and future applications of amorphous silicon and its alloys
2. Self-aligned bottom-gate submicrometer-channel-length a-Si-:H thin-film transistors
3. Ion implanted contacts to a-Si:H thin-film transistors
4. Thin-film transistors on a-Si:H
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