Subject
General Physics and Astronomy
Cited by
53 articles.
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1. Electromigration mechanisms in Sn-0.7Cu/Cu couples by four dimensional (4D) X-ray microtomography and electron backscatter diffraction (EBSD);Acta Materialia;2016-01
2. Basic Diode Laser Degradation Modes;Semiconductor Laser Engineering, Reliability and Diagnostics;2013-01-24
3. Low homologous temperature (<0.2) sputtering of indium films on silicon;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2012-11
4. Interfacial Reactions in Sn-Co-(Cu)/Ni Couples With/Without Current Stressing;Journal of Electronic Materials;2012-08-29
5. Tin Whiskers;Lead-Free Solders: Materials Reliability for Electronics;2012-03-15