Characterization of the diffraction properties of quantum-dot-array diffraction grating

Abstract

A new dispersive element named as quantum-dot-array diffraction grating [L. F. Cao, China patent No. 200410081499 (August 10, 2004)] for visible light has been developed and characterized experimentally. A large number of quantum dots distributed on a substrate as sinusoidal function can be used to diffract x rays without higher-order diffraction. The experimental patterns show that the higher-order diffractions which inevitably exist in the spectrum recorded using traditional diffraction gratings can be eliminated effectively by this newly designed element. It indicates that quantum-dot-array diffraction grating could be an attractive alternative of presently used diffraction grating in soft x-ray spectroscopy application to get rid of the higher-order diffraction distortions.