High resolution >40 keV x-ray radiography using an edge-on micro-flag backlighter at NIF-ARC-Reference-Cited by-同舟云学术

High resolution >40 keV x-ray radiography using an edge-on micro-flag backlighter at NIF-ARC

Published:2021-03-01 Issue:3 Volume:92 Page:033535
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Hill M. P.¹²^ORCID,Williams G. J.²^ORCID,Zylstra A. B.²^ORCID,Stan C. V.²^ORCID,Lockard T. E.²,Gumbrell E. T.¹,Rudd R. E.²,Powell P. D.²^ORCID,Swift D. C.²,McNaney J. M.²,Le Galloudec K. K.²,Remington B. A.²^ORCID,Park H. -S.²^ORCID

Affiliation:

1. AWE Plc, Aldermaston RG7 4PR, United Kingdom

2. Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore California 94550, USA

Funder

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Instrumentation

Link

https://aip.scitation.org/doi/am-pdf/10.1063/5.0043783

Reference24 articles.

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