Investigation of the thermal boundary resistance at the III-Nitride/substrate interface using optical methods
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2435799
Reference19 articles.
1. Pulsed photothermal reflectance measurement of the thermal conductivity of sputtered aluminum nitride thin films
2. The Effect of the Thermal Boundary Resistance on Self-Heating of AlGaN/GaN HFETs
3. Performance degradation of GaN field-effect transistors due to thermal boundary resistance at GaN∕substrate interface
4. Electric-field-induced heating and energy relaxation in GaN
5. Transient Thermal Characterization of AlGaN/GaN HEMTs Grown on Silicon
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