Development of laser assisted nanometric resolution scanning tunneling microscopy time-of-flight mass analyzer system
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1499764
Reference12 articles.
1. Tunneling Spectroscopy and Inverse Photoemission: Image and Field States
2. Approach to surface structure determination with the scanning tunneling microscope: Multiple-gap imaging and electron-scattering quantum-chemistry theory
3. Extraction and STM Imaging of Spherical Giant Fullerenes
4. Dynamic Observation of Reaction Processes of Pd with Si on a Si(111) 7 × 7 Surface after Thermal Treatment Using UHV−STM
5. Field-Induced Nanometer- to Atomic-Scale Manipulation of Silicon Surfaces with the STM
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