Modeling swift heavy ion irradiation of substrate-supported two-dimensional material via two-temperature molecular dynamics simulations

Author:

Shi Tan1ORCID,Xu Xiqiang1ORCID,Wan Hao2ORCID,Jia Pei3ORCID,Zhang Ping1ORCID,He Huan1ORCID,Gao Rui1,Lu Chenyang14ORCID

Affiliation:

1. School of Nuclear Science and Technology, Xi’an Jiaotong University 1 , Xi’an 710049, China

2. School of Mechanical and Electrical Engineering, Taizhou University 2 , Taizhou 225300, China

3. Testing Center Division, the 58th Research Institute of China Electronics Technology Group Corporation 3 , Wuxi 210000, China

4. State Key Laboratory of Multiphase Flow in Power Engineering, Xi’an Jiaotong University 4 , Xi’an 710049, China

Abstract

This study employs two-temperature molecular dynamics simulations to investigate swift heavy ion irradiation of SiO2 substrate-supported two-dimensional material graphene. Material-dependent electronic and thermal properties are integrated into each region to model the energy transfer between the electronic and atomic subsystems of the studied materials. Simulations of interactions with Xe heavy ions are performed with ion kinetic energies ranging from 0.5 to 25 GeV with electronic stopping powers from ∼2.6 to 17.7 keV/nm. With the studied ion energy range, nanopores with a diameter of up to 5 nm can be formed in graphene due to the thermally driven sputtering effect, while amorphization occurs along the ion track in the SiO2 substrate. The coupling between the substrate and two-dimensional material significantly impacts the structural change due to heat transfer and atomic interactions among different layers of materials. The method applied in this work provides a valuable tool for modeling and understanding the structural modifications induced by ion irradiation in layered structures.

Funder

National Natural Science Foundation of China

Wuxi Key Laboratory of Integrated Circuit Testing and Reliability

The Computing Center of Xi’an

Publisher

AIP Publishing

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3