Stress generation by electromigration
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.89024
Reference8 articles.
1. Electromigration and failure in electronics: An introduction
2. Electromigration—A brief survey and some recent results
3. Electromigration in thin aluminum films on titanium nitride
4. Reply to “The driving force for diffusion”
5. X‐Ray Extinction Contrast Topography of Silicon Strained by Thin Surface Films
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