Experimental determination of the nanocrystalline volume fraction in silicon thin films from Raman spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.99054
Reference20 articles.
1. High-Mobility Amorphous-Silicon MUS Transistors
2. Observation of the amorphous‐to‐crystalline transition in silicon by Raman scattering
3. Critical volume fraction of crystallinity for conductivity percolation in phosphorus‐doped Si:F:H alloys
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