Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films-Reference-Cited by-同舟云学术

Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films

Published:2015-09-07 Issue:9 Volume:118 Page:095302
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Schwarz T.¹,Cojocaru-Mirédin O.¹,Choi P.¹,Mousel M.²,Redinger A.²,Siebentritt S.²,Raabe D.¹

Affiliation:

1. Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straβe 1, 40237 Düsseldorf, Germany

2. Laboratory for Photovoltaics, Physics and Materials Science Research Unit, University of Luxembourg, L-4422 Belvaux, Luxembourg

Funder

Deutsche Forschungsgemeinschaft (DFG)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4929874

Reference53 articles.

1. Kesterites-a challenging material for solar cells

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3. The path towards a high-performance solution-processed kesterite solar cell

4. Device Characteristics of CZTSSe Thin-Film Solar Cells with 12.6% Efficiency

5. Properties of Cu(In,Ga)Se2 solar cells with new record efficiencies up to 21.7%

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