Multi-MHz time-of-flight electronic bandstructure imaging of graphene on Ir(111)-Reference-Cited by-同舟云学术

Multi-MHz time-of-flight electronic bandstructure imaging of graphene on Ir(111)

Published:2016-06-27 Issue:26 Volume:108 Page:261602
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Tusche C.¹²,Goslawski P.³^ORCID,Kutnyakhov D.⁴,Ellguth M.¹⁴,Medjanik K.⁴⁵,Elmers H. J.⁴,Chernov S.⁴,Wallauer R.⁴,Engel D.³,Jankowiak A.³,Schönhense G.⁴

Affiliation:

1. Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle, Germany

2. Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

3. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 12489 Berlin, Germany

4. Institut für Physik, Johannes Gutenberg-Universität, 55128 Mainz, Germany

5. MAX IV Laboratory, Ole Römers vag 1, 22363 Lund, Sweden

Funder

Bundesministerium für Bildung und Forschung (BMBF)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4955015

Reference17 articles.

1. Colloquium: Topological insulators

2. The electronic properties of graphene

3. Spin resolved bandstructure imaging with a high resolution momentum microscope

4. Tuning the Dirac Point Position inBi2Se3(0001)via Surface Carbon Doping

5. Momentum microscopy of the layered semiconductor TiS2and Ni intercalated Ni1/3TiS2

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