Giant second harmonic generation in two-dimensional tellurene with synthesis and thickness engineering

Author:

Liu Boqing1ORCID,Liang Kun1,Zhou Qingyi2ORCID,Khan Ahmed Raza13ORCID,Lu Zhuoyuan1ORCID,Yildirim Tanju4ORCID,Sun Xueqian1ORCID,Rahman Sharidya15ORCID,Liu Yun6ORCID,Yu Zongfu2ORCID,Lu Yuerui17ORCID

Affiliation:

1. School of Engineering, College of Engineering, Computing & Cybernetics, The Australian National University 1 , Canberra, ACT 2601,

2. Department of Electrical and Computer Engineering, University of Wisconsin-Madison 2 , Madison, Wisconsin 53706,

3. Department of Industrial and Manufacturing Engineering, University of Engineering and Technology Lahore (Rachna College Campus) 3 , Gujranwala 54700,

4. International Center for Young Scientists (ICYS), National Institute for Materials Science (NIMS) 4 , 1-1 Namiki, Tsukuba, Ibaraki 305-0044,

5. Department of Materials Science and Engineering, Monash University 5 , Clayton, VIC 3800,

6. Research School of Chemistry, College of Science, The Australian National University 6 , Canberra, ACT 2601,

7. ARC Centre of Excellence in Quantum Computation and Communication Technology ANU Node 7 , Canberra, ACT 2601,

Abstract

Second harmonic generation (SHG) is a prominent branch of non-linear optics (NLO) heavily reliant on conventional bulk NLO crystals. However, the difficulty in downsizing these crystals imposes technical limitations on the future of miniaturized NLO devices. Tellurene emerges as a promising candidate to overcome these restrictions, excelling in electrical applications and believed to possess a giant second-order optical susceptibility comparable to conventional NLO crystals. In this study, a face-to-face substrate configuration is employed for the synthesis of ultrathin tellurene via PVD. Our findings reveal that tellurene's SHG performance surpasses that of monolayer transition metal dichalcogenides by two orders of magnitude, with maximum efficiency when the flake thickness is between 16 and 20 nm under various wavelengths. High sensitivity to thickness variation encourages post-growth thinning through hydrogen plasma etching, enabling precise engineering of the flake thickness for optimal SHG. This establishes a foundation for controlled tellurene thickness, further broadening its potential in diverse applications.

Funder

Centre of Excellence for Quantum Computation and Communication Technology, Australian Research Council

National Heart Foundation of Australia

Australian Research council

Publisher

AIP Publishing

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