Nanoscale infrared imaging and spectroscopy of few-layer hexagonal boron nitride

Abstract

Nanoscale evaluation of the number of layers and boundaries in two-dimensional (2D) materials is crucial for understanding relationships between structure and property. Here, using scattering-type scanning near-field optical microscopy, we systematically studied on a nanoscale the infrared spectra and imaging of hexagonal boron nitride (h-BN), an ideal 2D insulating material. We revealed that the main factor determining the infrared amplitude changes at an optical frequency of about 1370 cm−1, corresponding to the in-plane phonon mode of h-BN. At lower frequencies, the amplitude is mainly determined by the local dielectric function of a sample and depends on the number of h-BN layers. At higher frequencies, it is affected by the phonon polariton waves of h-BN, and thus edges and grain boundaries of h-BN can be visualized due to the reflection of the waves at the boundary. The infrared spectra show a shoulder peak at higher frequencies, derived from the resonance with the phonon polaritons, in addition to a peak due to the in-plane phonon mode.