Study of Extended Electrically Active Defects in Heterostructures Based on (Ga,Mn)As/(In,Ga)As by Electron Beam-Induced Current and Deep-Level Transient Spectroscopy
-
Published:2019-01
Issue:
Volume:
Page:
-
ISSN:1027-4510
-
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
-
language:
-
Short-container-title:
您需要登录后可以查看相关数据！